I'm currently very new to nanotechnology. I do understand that it is possible to achieve an excellent topography image of a sample by SPM. However, is it possible to do SPM over a large area (for instance like in SEM, which is possible to image over 1x1 mm)? Theoretically speaking, I do not see any problem except that measurement time might be very high.

So, is it possible to scan over a large area (mm-scale)? If not, what can the reason be if one excluded measurement time. If yes, which technique will give an advantage for such measurement?

I would appreciate if anyone could explain the theory/mechanism behind this or point me to a place where I can obtain a better understanding.



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